DW-XRD-Y3000 Model X-Ray Diffraction Instrument
- Y3000 Series diffractometer is designed for materials research and industrial products analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.
- The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.
- High precision diffraction angle measurement system obtains more accurate results
- High stability of the X-ray generator control system gets more stable repeatability precision Programmable operation, integrated structure design, easy operation, elegant outlook.
X-ray Diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:
● Unkown samples in a variety of phase identification
● Mixed samples with known quantitative phase analysis
● Crystal structure analysis
● Crystal structure changes under Unconventional conditions (high temperature, low-temperature conditions)
● Analysis of material surface film
● Analysis of metal material texture and stress
● Analysis of metal material texture and stress
Technique parameter of DW-XRD-Y300 XRD
| XRD-Y3000 | |
| Rated power | 3kW |
| Tube voltage | 10-60kV |
| Tube current | 5-80mA |
| X-ray tuble | glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW |
| Focus size | 1 x 10mm or 0.4 x 14mm or 2 x 12mm |
| Stability | ≤0.01% |
| Goniometer structure | Horizontal ( θ-2 θ) |
| Radius of diffraction | 185mm |
| Scanning range | 0-164 |
| Scanning speed | 0.0012° – 70° min |
| Max. revolving speed | 100° /min |
| Scanning fashion | θ-2θ linkage, θ、2θ single action; continuous or stepping scanning |
| Angle repeatable accuracy | 1/1000° |
| Minimal stepping angle | 1/1000° |
| Detector | proportional counters(PC) or scintillation counters(SC) |
| Maximal counting rate of linearity | 5 x 105CPS ( with the compensate function of drop out counting ) |
| Energy resolution ratio | ≤25% (PC)、≤50% (SC) |
| Counting fashion | differential coefficient or integral, PHA automatically, Dead time regulate |
| Stability of system measure | ≤0.01% |
| Scattered rays dose | ≤1 μ Sv/h ( without X-ray protective device ) |
| Instrument integrative stability | ≤0.5% |
| Figure size | 1100 x 850 x 1750mm |
